Advantest to Showcase Comprehensive Line-up of SOC and Memory Platforms at SEMICON West 2012

SANTA CLARA, CA--(Marketwire - Jul 9, 2012) - Global semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) will showcase its full suite of test solutions at the SEMICON West 2012 trade show, July 10-12 in San Francisco, California. Advantest will feature technologies from its V93000 Smart Scale™ Generation and T2000 platforms that help to lower the cost of test and boost productivity for a variety of applications, including system-on-chip (SOCs) and system-in-package (SiPs) devices as well as advanced wafer-level chip-scale packages (WLCSPs). The company will also display its new DRAM/Flash and Burn-in solutions for high-performance memory test applications, along with scalable, MEMS-based probe cards for single-touchdown testing of wafers up to 300mm.

"Last year at SEMICON West, Advantest announced the completion of its acquisition of Verigy," said Keith Lee, president and CEO of Advantest America. "One year later, we are now a fully integrated company and operating as one. This week we are exhibiting our complete portfolio of test solutions that serve our expanding customer base."

Visitors can learn more about Advantest's products at the company's booth #6247 in the North Hall of the Moscone Convention Center. Additionally, Advantest's Senior Applications Engineer, Scott Chesnut will present "ATE Solutions to 3DIC Test Challenges" at the SEMICON West TechXPOT on Tuesday, July 10, from 3:35 p.m. to 4:00 p.m. 

About Advantest
A world-class technology company, Advantest is the leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments used in the design and production of electronic instruments and systems. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has recently introduced multi-vision metrology scanning electron microscopes essential to photomask manufacturing, as well as a groundbreaking 3D imaging and analysis tool. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More information is available at www.advantest.com.